ICS01.100.01

CCSJ04

團(tuán)體標(biāo)準(zhǔn)

T/SCGS313010—2024

磁粒子成像設(shè)備激勵系統(tǒng)

工作參數(shù)評價規(guī)范

Specificationforevaluationofoperatingparametersof

excitationsystemsformagneticparticleimagingequipment

2024?03?11發(fā)布2024?03?11實(shí)施

中國圖學(xué)學(xué)會發(fā)布

中國標(biāo)準(zhǔn)出版社出版

T/SCGS313010—2024

目次

前言··························································································································Ⅲ

引言··························································································································Ⅳ

1范圍·······················································································································1

2規(guī)范性引用文件········································································································1

3術(shù)語和定義··············································································································1

4磁粒子成像設(shè)備激勵系統(tǒng)····························································································2

4.1磁粒子成像設(shè)備系統(tǒng)組成······················································································2

4.2磁粒子成像設(shè)備組成和各部件主要功能····································································2

4.3激勵系統(tǒng)組成及功能····························································································3

5磁粒子成像設(shè)備激勵系統(tǒng)工作參數(shù)評價指標(biāo)····································································3

5.1概述·················································································································3

5.2激勵磁場均勻性指標(biāo)····························································································3

5.3機(jī)械結(jié)構(gòu)穩(wěn)定性指標(biāo)····························································································3

5.4系統(tǒng)電力穩(wěn)定性指標(biāo)····························································································4

5.5系統(tǒng)散熱效率指標(biāo)·······························································································4

6檢測方法·················································································································5

6.1通用要求···········································································································5

6.2激勵磁場均勻性檢測方法······················································································5

6.3機(jī)械結(jié)構(gòu)穩(wěn)定性檢測方法······················································································5

6.4系統(tǒng)電力穩(wěn)定性檢測方法······················································································5

6.5系統(tǒng)散熱效率檢測方法·························································································5

附錄A（規(guī)范性）激勵磁場均勻性檢測方法·······································································6

A.1檢測儀器··········································································································6

A.2準(zhǔn)備測試條件·····································································································6

A.3設(shè)置掃描參數(shù)·····································································································6

A.4測試激勵磁場均勻性方法······················································································6

A.5結(jié)果表述···········································································································7

附錄B（規(guī)范性）機(jī)械結(jié)構(gòu)穩(wěn)定性檢測方法········································································8

B.1制作機(jī)械結(jié)構(gòu)穩(wěn)定性檢測模體················································································8

B.2準(zhǔn)備測試條件·····································································································8

B.3設(shè)置掃描參數(shù)·····································································································8

B.4測試機(jī)械結(jié)構(gòu)穩(wěn)定性····························································································8

B.5結(jié)果表述···········································································································9

Ⅰ

T/SCGS313010—2024

附錄C（規(guī)范性）系統(tǒng)電力穩(wěn)定性檢測方法······································································10

C.1檢測儀器·········································································································10

C.2準(zhǔn)備測試條件···································································································10

C.3設(shè)置掃描參數(shù)···································································································10

C.4測試系統(tǒng)電力穩(wěn)定性··························································································10

C.5結(jié)果表述·········································································································10

附錄D（規(guī)范性）系統(tǒng)散熱效率檢測方法·········································································12

D.1檢測儀器·········································································································12

D.2準(zhǔn)備測試條件···································································································12

D.3設(shè)置掃描參數(shù)···································································································12

D.4檢測激勵線圈散熱情況·······················································································12

D.5結(jié)果表述·········································································································13

參考文獻(xiàn)····················································································································14

Ⅱ

T/SCGS313010—2024

前言

本文件按照GB/T1.1—2020《標(biāo)準(zhǔn)化工作導(dǎo)則第1部分：標(biāo)準(zhǔn)化文件的結(jié)構(gòu)和起草規(guī)則》的規(guī)

定起草。

請注意本文件的某些內(nèi)容可能涉及專利。本文件的發(fā)布機(jī)構(gòu)不承擔(dān)識別專利的責(zé)任。

本文件由北京航空航天大學(xué)提出。

本文件由中國圖學(xué)學(xué)會歸口。

本文件起草單位：北京航空航天大學(xué)、中國科學(xué)院自動化研究所、中國科學(xué)院昆明動物研究所。

本文件主要起草人：安羽、李光輝、杜洋、田捷、惠輝、劉晏君、雷思奧、何杰、張博、馮欣、鐘景、牟瑋、

劉振宇、尹琳、禹曉梅、王建紅、李鴻麗。

Ⅲ

T/SCGS313010—2024

引言

磁粒子成像是新一代生物醫(yī)學(xué)成像技術(shù)，基于磁粒子作為示蹤劑，利用其非線性磁化響應(yīng)信號，具

有高靈敏度、高特異性、高時空分辨率、無輻射且無成像深度限制等優(yōu)勢，在國內(nèi)外均得到了快速的發(fā)

展和應(yīng)用，且已展現(xiàn)出一定的技術(shù)積累和應(yīng)用潛力。目前，該技術(shù)已經(jīng)在檢測深層微小腫瘤、植介入血

管成像、在體細(xì)胞示蹤、實(shí)時動態(tài)血流監(jiān)測、腦卒中和腦損傷檢測、肺灌注成像等多領(lǐng)域開展預(yù)臨床研

究，被證明在臨床上具有廣泛的應(yīng)用前景。

磁粒子成像設(shè)備激勵系統(tǒng)的工作參數(shù)直接決定設(shè)備工作性能，影響成像質(zhì)量，最終關(guān)乎到診斷檢

查結(jié)果的準(zhǔn)確性。磁粒子成像設(shè)備工作激勵系統(tǒng)工作參數(shù)是設(shè)備性能的核心要素，這些參數(shù)的設(shè)定直

接關(guān)系到成像質(zhì)量，進(jìn)一步影響診斷結(jié)果的準(zhǔn)確性。然而磁粒子成像設(shè)備激勵系統(tǒng)的評價和規(guī)范方

面，目前尚無統(tǒng)一的標(biāo)準(zhǔn)和定量的指標(biāo)。因此對磁粒子成像設(shè)備激勵系統(tǒng)工作參數(shù)進(jìn)行評定和相關(guān)指

標(biāo)的定量分析，形成統(tǒng)一標(biāo)準(zhǔn)，具有重要意義。

本文件制定通用要求，以規(guī)范磁粒子成像設(shè)備激勵系統(tǒng)的研發(fā)與質(zhì)量評估，推動磁粒子成像技術(shù)

的高質(zhì)量發(fā)展。

本文件的發(fā)布機(jī)構(gòu)提請注意,聲明符合本文件時,可能涉及到專利（CN114533016B）“基于梯形波

激勵的多色定量磁納米粒子成像方法及系統(tǒng)”，（CN114521883B）“閉孔式無場線掃描磁粒子成像裝置、

系統(tǒng)及方法”，（CN115778353B）“基于旋轉(zhuǎn)諧波圖的磁場自由線磁粒子成像方法”，（CN115153490B）

“基于非旋轉(zhuǎn)場自由線的磁納米粒子檢測成像裝置、方法”，（CN117686954B）“基于振蕩梯度磁場編碼

的磁粒子成像方法及設(shè)備”，（US11,454,681B1）“Magneticparticleimagingmethodbasedonnon?ideal

fieldfreepoint”以及相關(guān)的專利的使用。

本文件的發(fā)布機(jī)構(gòu)對于這些專利的真實(shí)性、有效性和范圍無任何立場。

該專利持有人已向本文件的發(fā)布機(jī)構(gòu)承諾,他們愿意同任何申請人在合理且無歧視的條款和條件

下,就專利授權(quán)許可進(jìn)行談判。該專利持有人的聲明在本文件的發(fā)布機(jī)構(gòu)備案。相關(guān)信息可以通過以

下聯(lián)系方式獲得：

專利持有人姓名：田捷、安羽、惠輝、唐振超、李光輝、劉晏君、雷思奧、何杰、張博、張浩然、鐘景；

地址：北京市海淀區(qū)花園路街道37號北京航空航天大學(xué)學(xué)院路校區(qū)。

請注意除上述專利外，本文件的某些內(nèi)容仍可能涉及專利。本文件的發(fā)布機(jī)構(gòu)不承擔(dān)識別專利的

責(zé)任。

Ⅳ

T/SCGS313010—2024

磁粒子成像設(shè)備激勵系統(tǒng)

工作參數(shù)評價規(guī)范

1范圍

本文件規(guī)定了磁粒子成像設(shè)備激勵系統(tǒng)工作參數(shù)評價指標(biāo)與檢測方法。

本文件適用于永磁體、常導(dǎo)磁體和超導(dǎo)磁體磁粒子成像設(shè)備的驗(yàn)收檢驗(yàn)和狀態(tài)檢驗(yàn)。

2規(guī)范性引用文件

下列文件中的內(nèi)容通過文中的規(guī)范性引用而構(gòu)成本文件必不可少的條款。其中，注日期的引用文

件，僅該日期對應(yīng)的版本適用于本文件；不注日期的引用文件，其最新版本（包括所有的修改單