電磁兼容(EMC)介紹

IntroductionToEMC電磁兼容EMC(ElectromagneticCompatibility)的定義：裝置能在身處的電磁環境中正常工作而本身產生的電磁干擾不影響環境中其他裝置的正常工作。EMCstandsforElectro-MagneticCompatibility.Itistheabilityofasystemorproducttofunctionproperlyinitselectromagneticenvironment,withoutintroducingintolerableelectromagneticdisturbancestoanythinginthatenvironment.

EMC包括電磁干擾（EMI）和抗電磁干擾（EMS）兩個部分。ItcoversbothElectro-MagneticInterference(EMI)andElectro-MagneticSusceptibility(EMS).什么是EMC

WhatisEMC?

電磁兼容

發射干擾

抗擾傳導發射輻射發射傳導抗擾輻射抗擾什么是EMC

WhatisEMC?主題

TOPICS1.發射干擾Emission

2.抗擾Immunity3.10m半波暗室10mSAC4.屏蔽室LocalShieldedRoom

發射干擾是指產品或系統沿著電力線傳輸或通過空間傳輸的射頻電磁能量，并對其所處的電磁環境造成干擾或污染。Emissionistheradiofrequencyenergyofaproductorsystembeingtransmittedalongthepowercordorthroughspaceasunwantedelectromagneticpollution/interferences.

發射干擾可以分為兩部分：Emissionrequirementscanbedividedintotwocategories:

傳導發射-傳導發射標準的限值規定了150KHz到30MHz的頻率范圍內通過與系統連接的電纜（電源線、信號線等）耦合的傳導干擾。

ConductedEmissions-Conductedemissionsstandardslimittheconducteddisturbancesinthe150KHzto30MHzfrequencyrange.Thislimitstheemissionscoupledthroughcable(mains,signalcables)connectingtothesystem.輻射發射-輻射發射的限值是在30MHz到1GHz頻率范圍內規定的，它保證了設備不會干擾到附近運行的系統。

RadiatedEmission-Radiatedemissionsstandardsimposelimitsontheradiateddisturbancesinthe30MHzto1GHzfrequencyrange.Thisensuresthattheequipmentwillnotinterferewiththeoperationofsystemsinitsvicinity.1.發射干擾Emission1.1

傳導發射測試ConductedEmissionTest(Conducted)1.2輻射發射測試RadiatedEmissionTest(Radiated)1.3干擾功率測試PowerInterferenceTest(Radiated)1.4非連續干擾測試DiscontinuousDisturbancesTest(Conducted)1.5電流諧波測試HarmonicsCurrentTest(Conducted)1.6電壓閃爍測試FlickerTest(Conducted)1.發射干擾Emission這項測試檢測產生于EUT(待測物)內部并且通過I/O線，控制線或電源線傳輸的干擾。要求EUT產生的傳導發射干擾小于如CISPR22orEN55022等國際標準所規定的限值。AtestistomeasurethepotentialinterferencegeneratedinsideanEUTandcarriedthroughtheI/Olines,thecontrolleads,orpowerlines.ThistestisrequiredtoensurethattheconductedemissionofthetestedEUTmeetspre-definedlimitsassetbyvariousnationalandinternationalstandardse.g.CISPR22orEN55022.EUT0.8mLISNbundledto<40mm>0.4m0.8mMainsexcessleadHorizontalGroundPlaneVerticalGroundPlane

SupplyMainsReceiver1.1

傳導發射測試ConductedEmissionTest限值線LimitLines

1.1

傳導發射測試ConductedEmissionTest1.1

傳導發射測試ConductedEmissionTestNNNNNYYYYY以峰值檢坡器測量時使用的決策樹。Decisiontreeforpeakdetectormeasurement.應用EN55022標準的波形示例SampleplotforEN55022

1.1

傳導發射測試ConductedEmissionTestEquipmentListEquipmentCapabilityManufacturerEMIReceiver-SCR3052CFrequencyRange:9kHzto2.75GHzSchaffnerRFSwitch–NS4901DualChannelToyoSpectrumAnalyzer–R3131AFrequencyRange:9kHzto3GHzAdvantestLISN–NNB42CImpedance:50ohmsSchaffnerSpectrumAnalyzerEMIReceiverRFSwitchLISN(LineImpedanceStabilizingNetwork)1.1

傳導發射測試ConductedEmissionTest這項測試檢測EUT產生的通過空間傳播的干擾信號,這些信號由天線接收，由接收機測量，從而保證能符合例如CISPR22等相關EMC標準。天線放置在離EUT10米遠的地方，在1米到4米間的高度上測量水平和垂直兩個方向。放置在轉臺桌子上的EUT隨著桌子做360度的旋轉。AtestthatlooksfordisturbancesignalsthataretransmittedbytheEUTthroughspace.ThesesignalsarethenreceivedbytheantennaandmeasuredwithareceivertoensurethattheyarebelowtheacceptablelimitssetbytherelevantEMCstandard,e.g.CISPR22.Theantennaispositioned10mfromtheEUTandisorientedinbothhorizontalandverticalpolarizationforaheightfrom1mto4m.TheEUTwillberotatedin360degreeontheturntable.1.2輻射發射測試RadiatedEmissionTestEUT0.8mTurntablemains1mto4mGroundPlaneMeasurementDistance=10m1.2輻射發射測試RadiatedEmissionTestNYNY以峰值檢坡器測量時使用的決策樹。Decisiontreeforpeakdetectormeasurement.EquipmentListEquipmentCapabilityManufacturerEMIReceiver-SCR3512FrequencyRange:9kHzto2.75GHzSchaffnerRFSwitch–NS4901DualChannelToyoSpectrumAnalyzer–R3132AFrequencyRange:9kHzto3GHzAdvantestPre-amplifier–8447DFrequencyRange:100kHzto1.3GHzAgilentBilogAntenna–CBL6112BFrequencyRange:30MHzto2GHzSchaffnerAttenuationClamp–CMAD10-3FrequencyRange:30MHzto1GHzSchaffnerAntennaEMIReceiverSpectrumAnalyzerRFSwitchPre-amplifierAttenuationClamp

1.2輻射發射測試RadiatedEmissionTest此項測試使用吸收鉗來測量連接線上的干擾功率。連續干擾可能是寬帶干擾，由機械開關、換向器、或半導體整流管等開關設備產生。也可能是窄帶干擾，由單片機等電子控制裝置等產生。Ameasurementofdisturbancespoweronconnectedcables,usinganabsorbingclamp.Continuousdisturbancemaybeeitherbroadband,causedbyswitchingdevicessuchasmechanicalswitches,commutatorsorsemiconductorregulators,ormaybenarrowband,causedbyelectroniccontroldevicessuchasmicroprocessors.

1.3干擾功率測試PowerInterferenceTestCISPR14-1或EN55014-1標準所涉及的家用電器，電動工具以及類似設備需要進行此項測試。Thistestisapplicabletohouseholdappliances,electrictoolsandsimilarapparatustomeettheemissionstandardCISPR14-1orEN55014-1.EUT0.8mMeasurementDistance=5mTospectrumanalyzerortestreceiverAbsorbingClampAuxiliaryClampToMainsSupplyEquipmentListEquipmentCapabilityManufacturerEMIReceiver-HP8542EFrequencyrange:9kHzto2.9GHzHPAbsorbingClamp–AMZ41CFrequencyrange:30MHzto1GHzSchaffnerAutomaticSlider–MAC600FAutomaticToyoAbsorbingClampEMIReceiverAutomaticSlider1.3干擾功率測試PowerInterferenceTest非連續干擾測試也叫Click測試。定義為超出連續發射限值且持續時間小于200ms的干擾，而兩個連續的干擾中間必需有200ms以上區隔。Discontinuousdisturbanceiscommonlyknownas‘Click’.Itisdefinedasadisturbanceexceedingthelimitofacontinuousemissionfornotlongerthan200ms,andisseparatedfromasubsequentdisturbancebyatleast200ms.

一個click可能包括一系列的脈沖，則其持續時間是從第一個脈沖起始的時刻到最后一個脈沖結束的時刻。AClickmaycontainanumberofimpulses;inwhichcasetherelevanttimeisthatfromthebeginningofthefirsttotheendofthelastimpulse.

1.4非連續干擾測試DiscontinuousDisturbancesTest能沿著電源線產生非連續干擾的家用電器，電動工具以及類似設備需要進行此行測試。應用的標準是CISPR14-1或EN55014-1。Thistestisapplicabletohouseholdappliances,electrictoolsandsimilarapparatuswherebythediscontinuousdisturbancesaregeneratedalongthepowersupplycabling.TheapplicablestandardisCISPR14-1orEN55014-1.AnalyzerEUTMainsACsourceLISNEquipmentListEquipmentCapabilityManufacturerAnalyzer-DIA1512CFrequency:150kHz,500kHz,1.4MHz,30MHzSchaffner3phaseoptionforanalyzer–DIA1530ACurrentcapability:30AcontinuousSchaffnerLISN–NNB42CForbothsingleorthreephaseEUTSchaffnerAnalyzerLISN(LineImpedanceStabilizingNetwork)1.4非連續干擾測試DiscontinuousDisturbancesTest此項測試適用于每相輸入電流不大于16A，并打算連接到相電壓為220V到250V、頻率為50Hz的公共低壓配電系統的電氣和電子設備。Applicabletoelectricalandelectronicequipmenthavinganinputcurrentuptoandincluding16Aperphase,andintendedtobeconnectedtopubliclow-voltagedistributionsystemsofbetween220Vand250Vat50Hzlinetoneutral.1.5電流諧波測試

HarmonicsCurrentTest設備分類：Classificationofequipment:ClassA-不包含在ClassB，C和D中的所有設備

ClassA–AllequipmentthatarenotClassB,CorDClassB-手持式設備

ClassB–PortableToolsClassC–燈具設備

ClassC–LightingequipmentClassD-功率小于600W的個人電腦，監視器以及電視機

ClassD–Personalcomputersandpersonalcomputermonitorsandtelevisionreceivershavingpower≤600WMainsEUTHarmonic&FlickerAnalyzerACsourceEquipmentListEquipmentCapabilityManufacturerPoweranalyzer-PM3000AFrequencyrange:0Hz–1MHzMax.voltage:2kVMax.current:30AVoltechACsource–6530Max.power:3kVAChromaProflinesystem-2103-240Max.power:3kVASchaffnerACSourcePowerAnalyzerProfLineSystem1.5電流諧波測試

HarmonicsCurrentTest閃爍定義：亮度或頻譜分布隨時間變化的光刺激所引起的不穩定的視覺效果。Flickerisdefinedastheimpressionofunsteadinessofvisualsensationinducedbyalightstimuluswhoseluminanceorspectraldistributionfluctuateswithtime.此項測試適用于單相輸入電流不大于16A，并連接到相電壓為220V到250V，頻率為50Hz的公共低壓配電系統使用的電氣電子設備。Applicabletoelectricalandelectronicequipmenthavinganinputcurrentuptoandincluding16Aperphaseandintendedtobeconnectedtopubliclow-voltagedistributionsystemsofbetween220Vand250Vat50Hzlinetoneutral.

1.6電壓閃爍測試FlickerTestMainsEUTHarmonic&FlickerAnalyzerACsourceEquipmentListEquipmentCapabilityManufacturerProflinesystem-2103-240Max.power:3kVASchaffnerProfLineSystem1.6電壓閃爍測試FlickerTest由于產品或系統與其他的設備共處于一個電磁環境中，它除了可能對其他設備產生潛在的干擾外，還可能被其他設備所干擾。Besidesproducingpotentialinterference,aproductorsystemisalwaysexposedtoacertainamountofambientelectromagneticpollutionfromotherpre-existingsources.抗擾度是指產品或系統在被污染的電磁環境中的免疫能力。Immunityistheabilityoftheproductorsystemtoimmunetothereasonableamountofelectromagneticpollutionorinterference.2.抗擾度Immunity抗擾度測試有四個主要的判據：Thereare4performancecriteriaforimmunitytests:判據A：測試過程中不允許出現功能缺失的現象。

PerformanceCriteriaA:Nolossoffunctionisallowedduringtesting.判據B：測試過程中允許出現暫時的功能缺失的情況，但設備必須 可以自行恢復到正常工作狀態。

PerformanceCriteriaB:Temporarylossoffunctionisallowedduringtesting,

buttheequipment

mustself-recoverstoitsnormal

operatingcondition.判據C：測試過程中允許出現功能缺失的情況，并且不能自行恢 復，必須依靠操作人員的介入才可恢復。

PerformanceCriteriaC:Temporarylossoffunctionisallowedduringthetestand requiresoperatorintervention.判據D：測試過程中由于受測品，元件，軟件損壞，或數據的損失 導致無法恢復的劣化或功能缺失。

PerformanceCriteriaD:Degradationorlossoffunctionwhichisnotrecoverable duetodamagetoequipment,components,softwareor lossofdata.2.抗擾度Immunity2.1EN61000-4-2

靜電放電測試

(ESD)2.2EN61000-4-3輻射抗擾度測試(RadiatedImmunity)2.3EN61000-4-4電快速瞬變脈沖群抗擾度測試(EFT/Burst)2.4EN61000-4-5雷擊浪涌抗擾度測試(Surge)2.5EN61000-4-6傳導抗擾度測試(ConductedRF)2.6EN61000-4-8工頻磁場抗擾度測試(PowerFrequencyMagnetic)2.7EN61000-4-11電壓跌落、短時中斷和變化抗擾度測試

(VoltageDips,InterruptionsandVariation)2.抗擾度測試Immunity(EN55024)靜電放電是指靜電荷從一個物體突然轉移到另一個物體的過程。例如：操作人員對接觸設備放電。這種放電可能會導致設備的誤動作或者損壞某些電子元器件。ElectrostaticDischarge(ESD)isasuddentransferofstaticelectricchargefromonebodytoanothere.g.anoperatordischarge.Theeffectsofsuchdischargemaybeasimplemalfunctionoftheequipmentordamageofelectroniccomponents.

靜電放電有兩種放電類型-接觸放電和空氣放電Consiststwotypesofdischargetest–ContactDischargeandAirDischarge.2.1靜電放電測試ESDTest試驗設置Testsetup2.1靜電放電測試ESDTestEquipmentListEquipmentCapabilityManufacturerESDtester-NSG435ContactDischarge:

200Vto9kVSchaffnerAirDischarge:200Vto16.5kVESDtester2.1靜電放電測試ESDTest這是與輻射發射相反的一項測試，在這項測試中，通過功率放大器提供一定的功率給天線來產生干擾信號并通過空間傳播給EUT。天線放于3米遠的位置，在水平和垂直方向上對EUT的四個面進行測試。要求EUT符合抗擾度標準EN61000-4-3。ItisthereverseofRadiatedEmissionTestwherebyapoweramplifierisusedtoprovidethenecessarypowertotheantennatoestablishthedisturbancesignalstobetransmittedtotheEUTthroughspace.Theantennaispositioned3metersfromallfourfacesoftheEUTandisorientedinhorizontalandverticalpolarization.TheEUTshallfulfilltheperformancecriteriapertheimmunitystandarde.gEN61000-4-3.2.2輻射抗擾度測試

RadiatedImmunityTestEUT0.8mTurntableMainsGroundPlaneMeasurementDistance=3mAbsorbersEquipmentListEquipmentCapabilityManufacturerSignalGenerator–2023BFrequencyRange:9KHzto2GHzIFRRFSwitch–NS4901DualChannelToyoPowerMeter–4232DualChannelBoontonPowerProbe–51011-EMCFrequencyRange:1kHzto7GHz;-60dBmto+20dBmBoontonPowerAmplifier–CBA9413&CBA9429FrequencyRange:80MHzto1GHz;100W&0.8GHzto3GHz;75WSchaffnerX-WingBilogAntenna–CBL6140AFrequencyRange:26MHzto2GHzSchaffnerDirectionalCoupler–DCP0100FrequencyRange:150kHzto1GHz;100WSchaffnerDirectionalCoupler–DC7141FrequencyRange:1GHzto3GHzAR2.2輻射抗擾度測試

RadiatedImmunityTestSignalGeneratorPowerMeter&PowerProbePowerAmplifier

AntennaRFSwitchDirectionalCoupler2.2輻射抗擾度測試

RadiatedImmunityTestEFT/Burst通常發生在電網中機械開關切換時，此時開關的兩點之間可能產生飛弧現象或者類似熒光燈內中的氣體放電現象。這會對附近的電氣電子設備產生危害。這種現象不需要傳導路徑就可以發生。ElectricalFastTransient(EFT)/Burstoftencausedduringtheopeningofaswitchwherebyarcingoccursbetweenthecontactsoranactivationofthegaseousdischargeasinafluorescentlights,andthevictimproductisnearby.Suchoccurrencesmaynotneedadirectconductpath.2.3電快速瞬變脈沖群抗擾度測試EFT/BurstTest試驗設置Testsetup2.3電快速瞬變脈沖群抗擾度測試EFT/BurstTestEquipmentListEquipmentCapabilityManufacturerBursttester-NSG2025PulseAmplitude:200Vto4.4kVSchaffnerRiseTime:5ns+/-30%RepetitionRate:100msto10s+/-2msBurstGenerator2.3電快速瞬變脈沖群抗擾度測試EFT/BurstTest雷擊浪涌一般發生在雷擊或高壓電路中容性負載切換時，遭受雷擊的可能是電網系統或是附近的地面。雷擊浪涌通常通過電源線使設備受到影響。它產生的巨大能量很容易損壞設備中的元器件。Surgeiscommonlycausedbythelightningstrikesorswitchingofcapacitiveloadfromahighvoltagecircuit,eitherdirectlytothepowerdistributionsystemortothenearbyground.Thissurgewillnormallyaffectaproductthroughthepowerline.It’shighenergiescouldeasilycausecomponentdamage.2.4雷擊浪涌抗擾度測試SurgeTest試驗設置Testsetup2.4雷擊浪涌抗擾度測試SurgeTestEquipmentListEquipmentCapabilityManufacturerSurgetester-NSG2050HybridPulse:1.2/50us–8/20us,200Vto6.6kV,2ohmsand12ohmsSchaffnerCouplingnetwork–CDN131/133RingWave:0.5us/100kHz,200Vto6.6kV,12ohms,30ohmsand200ohmsSchaffnerImpulsenetwork–PNW2050/PNW2052RepetitionRate:10sto10000sSchaffnerImpulseNetworkSurgeGenerator2.4雷擊浪涌抗擾度測試SurgeTest這項測試所用的干擾來源是由射頻場感應產生的電磁場。干擾會通過連接到設備上的電纜線對設備產生影響。Thesourceofdisturbancecoveredbythistestisbasicallyanelectromagneticfield,comingfromintendedRFtransmitters,thatmayactonthewholelengthofcablesconnectedtoaninstalledequipment.

可以通過直接給電纜線注入噪聲來產生干擾。Thisdisturbancecanbeproducedbyinjectinganoisedirectlyintothecables.測試時每根連接EUT的電纜線都要注入射頻電壓或電流。ThetestinginvolvesinjectingRFvoltagesorcurrentsintoeachofthecablesassociatedwiththeEUT.2.5傳導抗擾度測試ConductedRFImmunityTest試驗設置

Testsetup2.5傳導抗擾度測試ConductedRFImmunityTestEquipmentListEquipmentCapabilityManufacturerMainSystem-NSG2070Bandwidth:100kHz–250MHzSchaffnerCouplingNetwork-CDNM016SModulation:0–100%SchaffnerAttenuationClamp-KEMA801CFrequencyrange:150kHz–1GHzSchaffnerAttenuationClampCouplingNetworkGenerator2.5傳導抗擾度測試ConductedRFImmunityTest工頻磁場是由導體中的交流電流產生。例如：電網中50/60Hz電流的電源線產生的磁場。這個磁場可能會干擾到附近運行中的電氣電子設備。PowerfrequencymagneticfieldsaregeneratedbyACcurrentflowingintheconductorse.g.normal50/60Hzmainspowercord.Thismagneticfieldsmayinterferewithequipmentoperatedincloseproximity.

這項測試檢測設備在附近有工頻磁場的情況下，對磁場騷擾的抵抗能力。工頻磁場抗擾度與設備放置的具體位置及設備的安裝有關(如設備與干擾源的距離)。Thistestisintendedtodemonstratetheimmunityofanequipmentwhensubjectedtopowerfrequencymagneticfieldsrelatedtothespecificlocationsandinstallationconditionoftheequipment(e.g.proximityofequipmenttothedisturbancesource).2.6工頻磁場抗擾度測試PowerFreqMagneticTest試驗設置

Testsetup2.6工頻磁場抗擾度測試PowerFreqMagneticTestEquipmentListEquipmentCapabilityManufacturerMainSystem–Modula6000Inputpower:85to265Vac;47to63Hz;16AcontinuousSchaffnerTestCoil-INA721Fieldstrength:0.1to4A/mSchaffnerTestCoilGenerator2.6工頻磁場抗擾度測試PowerFreqMagneticTest電壓跌落和短時中斷是由電網中偶爾發生的故障或負載的急劇變化產生的。在這種情況下，可能發生兩個甚至更多連續的電壓跌落或中斷。Voltagedipsandshortinterruptionsarecausedbyfaultsinthenetwork,ininstallationsorbyasuddenlargechangeofload.Incertaincases,twoormoreconsecutivedipsorinterruptionsmayoccur.電壓變化是由連接到電網的負載不斷改變而造成的。Voltagevariationsarecausedbythecontinuouslyvaryingloadsconnectedtothemainssupplynetwork.2.7電壓跌落、短時中斷和變化的抗擾度測試

VoltageDips,ShortInterruptionsAndVoltageVariation Test這些現象隨機發生的，并且可以用其額定電壓和周期的偏差來描述。Thesephenomenaarerandominnatureandcanbecharacterizedintermsofthedeviationfromtheratedvoltageandduration.

在這些情況下，電壓的變化都會影響鄰近的電氣電子設備的正常工作甚至給設備造成損壞。Inanycase,thevoltagechangesproducedcanaffecttheoperationordamagethenearbyelectricalandelectronicequipment.MainsEUTGenerator試驗設置

Testsetup2.7電壓跌落、短時中斷和變化的抗擾度測試

VoltageDips,ShortInterruptionsAndVoltageVariation TestEquipmentListEquipmentCapabilityManufacturerProflinesystem-2103-240Max.power:3kVASchaffnerProfLineSystem2.7電壓跌落、短時中斷和變化的抗擾度測試

VoltageDips,ShortInterruptionsAndVoltageVariation Test模擬開放場地建立一個室內的電波暗室來進行測試以避免戶外測試遇到的很多問題。Insteadofconductingatestinanopenareatestsite,OATS,indooranechoicchambershavebeendevelopedtoavoidthemanyproblemsassociatedwithoutdoortesting.暗室提供了一個安靜的測試環境，排除了會影響測試的不必要干擾。Thesechambersalsoprovideaquietambientduringtestingsothatthereisnootherunwantedinterferencethatinterferewiththemeasurement.

3.10米半波暗室10mSemi-AnechoicChamber電波暗室墻上貼有射頻吸波材料，可以將反射波的幅度減少到一個可以接受的水平。被吸收的波以熱能的形式被儲存在吸波材料中。Thesechambersarelinedwithradiofrequency-absorbingmateri