Agilent3070系統介紹

&軟硬件綜述第1頁概要Part13070系統介紹Part23070硬件綜述Part33070軟件綜述Part4基本測試原理第2頁Part13070系統介紹概要在線測試（ICT）在產線中位置ICT基本測試原理Agilent3x7y系列測試界面–夾具安全事項測試程序開發流程測試工具第3頁在線測試（ICT）在產線中位置SP505DXSeries5000

SJ50SeriesII

SJ50SeriesIIXL

SJ50SeriesIIValue3070Series3目標:盡早發覺制造缺點－降低PCB板制造成本第4頁Agilent3070基本測試原理Agilent3070第5頁Agilent3070基本測試原理通常是PCB板安裝完成后第一次電學測試經過檢測PCBA上單個或多個元器件來驗證器件值檢驗器件安放位置確認電路連接查找PCB制造中缺點（短路，開路，錯件及零件錯位等）第6頁常見制造缺點焊點短路第7頁常見制造缺點焊點開路第8頁常見制造缺點零件安裝錯位第9頁常見制造缺點零件翹起第10頁在線測試功效(Summary)模擬器件測試上電測試數字測試局部功效測試準確測試特殊測試驗證PCB安裝過程在測試階段盡快消除顯著PCBA上零件錯誤提供最正確測試方案以取得最大測試覆蓋率第11頁Agilent3x7y系列5184nodes2592nodes1296nodes第12頁Agilent3x7y系列ProcessTesterLowCostTesterHighPerformanceTester3X723X733X75TestCapabilities&StandardProducts:ShortsAnalogICTQuick70Short-wirefixturingPanelTestTestJetTestCapabilities&StandardProducts:ShortsAnalogICTAnalogfunctionalIn-circuitboundaryscanQuick70ShortwirefixturingPanelTestTestJetTestCapabilities&StandardProducts:ShortsAnalogICTanalogfunctionalin-circuitboundaryscanQuick70shortwirefixturingPanelTestTestJetDynamicTestAccessflashprogrammingsolutionPolarityCheck第13頁Agilent3x7y系列30703x71-unpowerorlimitedpowersystem3x72-ProcessTestSystem3x73-IncircuitTestSystem3x74-FunctionalTestSystem3x75-CombinationTestSystem3x79-TelecommunacationsTestSystem第14頁測試界面–夾具第15頁短線夾具結構第16頁為何選取短線夾具第17頁安全事項第18頁測試程序開發流程第19頁測試工具第20頁Part23070硬件綜述OutlineAgilent3070結構DUTPowerSupplyTestheadModuleDesignationsCardsinTestheadMotherCardModuleControlCardASRUCardPinCard第21頁AnatomyofAgilent3070第22頁AnatomyofAgilent3070(Cont.)第23頁DUTPowerSuppliesCurrentVoltageOutputNumberAgilent6621AHighLow2Agilent6624AMediumMedium4Agilent6634ALowHigh1Agilent6642AHighHigh1第24頁Testhead第25頁ModuleDesignations第26頁CardsintheTestheadMotherCardModuleControlCardAnalogStimulus-ResponseUnit(ASRU)CardPinCards第27頁MotherCard提供系統內部板卡DC電源SuppliesDCpower分配電信號到指定ModuleControlCard解析地址Decodesaddress第28頁MotherCard(Cont.)MultiplexingtheASRUcardtopincardsbymothercard第29頁ModuleControlCard控制實際測試過程程序自動讀取碼(AutofileCode)帶有8個通用開關(GPRelay)必須放在每個module第6槽位四種類型:ControlCardControlPlusCardControlXTCardControlXTP第30頁ASRUCard提供正確激勵信號Appliestheappropriatestimulus使用測量運算放大器進行電壓信號測量MakesavoltagemeasurementwithMOA(MeasuringOperationalAmplifier)提供直流點信號和波形發生器ProvidesDCsourceandawaveformgenerator分配在1號槽Residesinslot1有A,B,C三個版本第31頁PinCardHybridDoubleDensityCardHybrid32CardChannelPlusCard(Nolongeravailable,butstillsupported)AccessPlusCardAnalogPlusCardSerialTestPlusCard(STC+)第32頁HybridDoubleDensityCardTwosides:SideA,SideBMUXratio(MINTpins:D/Rlines):9:216channelsx9pins=144MINTpins第33頁Hybrid32Card第34頁Part33070軟件綜述概要標準測試流程軟件綜述BT-Basic及相關命令3070操作步驟測試原理第35頁標準測試流程UnpoweredtestsShorts&PinstestingAnalogIncircuittestingTestJettestingSetupPowerSuppliesDigitalIncircuittestingAnalogPoweredtestingPoweredtests第36頁軟件綜述第37頁BT-Basic界面StatuslineCommandlineOperatingmodeProcessIDnumberWorkingspaceSpecialfunctionkeys第38頁快捷鍵F1–Edit/CommandF2–RecallPlusF3–RecallMinusF4–ExecuteF5–Mark/SecondMark/ClearMarkF6–TestConsultantF7–PushbuttonQSTATSF8–StoreLineF9–InsertLineF10–DeleteLineF11–ClearLineF12–ClearDisplay第39頁操作模式第40頁慣用BT-Basic命令catchangechange“A”to“BA”changemchangem“cd”to“ab”copytocopy<file1>to<directory2>copyovercopy<file1>over<directory2>/<file3>createdirdeleteduplicate第41頁慣用BT-Basic命令editfind,findnfind“string1”,findn“string2”get,loadmergemerge“file1”;“file2”,5,6;“file3”movemsi,msi$numberscratchsave,re-savesave“file1”第42頁操作步驟打開系統電源Turnonsystem用設定用戶名登陸Logonashp3070user打開BT-BasicOpenBT-Basic進入到待測板目錄Gettoboardtestdirectory輸入：testheadpoweron,testheadis1輸入：load“testplan”索緊夾具Fixturelock運行程式Run松開夾具Fixtureunlock輸入：testheadpoweroff,testheadis*退出BT-Basic操作exit登出logoff關機shutdown第43頁Testhead操作命令testheadpoweron/offtestheadis1/*fixturelock/unlockfaon/faoffexit第44頁Testhead‘Config’file第45頁Testhead‘Config’file(Cont.)Thefilemustbelocatedinthe/..3070/diagnostics/th1/directoryThefilemustbecompiledwiththetestheadoptionThetestheadmaynotbootiftheconfigfileinincorrectThistestheadconfigfileisdefinedduringtheinitialsysteminstallationThetestheadconfigfilemaynotbeusedasaboardlevelconfigfile第46頁Board‘Config’file第47頁Part4基本測試原理測試流程回顧‘testplan’模擬測試基本原理慣用測試選項介紹BoardConsultantPushbuttonDebugOtherIssue第48頁標準測試流程UnpoweredtestsShorts&PinstestingAnalogIncircuittestingTestJettestingSetupPowerSuppliesDigitalIncircuittestingAnalogPoweredtestingPoweredtests第49頁AnalogTest–“testplan”第50頁Analogtest-concept第51頁Analogtestbasic第52頁Shortstest第53頁Shortstest(Cont.)Expectsshorts?Jumpers?Closedswitches?Fuses?Smallvalueresistors?Etc.Unexpectedshorts?Highimpedancenodes?Digitalpins?Resistorsabove10kUnexpectedshorts?Lowimpedancenodes?Powernodes?Resistorsbelow10k第54頁Shortstest(Cont.)第55頁Pinstest第56頁Resistivetest第57頁CapacitororInductortest第58頁StatementsyntaxCapacitorcapacitor<value>,<+tol>,<-tol>,<return>,<comp/nocomp>Diodedi