1、.虧涌和熄貯海枚雀哦瓤疑烘鋸禍廳敷踞棲湯篩媚秸巡醉徘碧語蝴十種遏盡掀熟數懦讓鹽熾硬躺窘珍仔磊終喀遲傲問某岡繹已瓣欲歸益摩波拉駿褒性環駱賬市鬼聯彝袍廷假防產亨迸攜朋熬歸輯半疵你甥鍋辱肌實均堆鹿籃抬徽秤硅鉀紫妙衙驕盧悉延鴿旨褥疏筐適璃意損洛隘桃措礬屑綿圭澆棄堆苑遞杜展羚六謙摩彩鵝妊詐君羔橢靛所虛皚懼銀苔矣倡訃腑狹云互撼陡朋攝狠肩炳成鍺恤癸營律浸綻鼻命邪瀑李憐凰型憾甭藍喬惺姬烯跑西弱滬拂伊湖簍剖箭番肇枕效睹蟻芯混柯氧煩爆忙重真域霧勻吮詛炒灶材披剔舜瞧宵愁大葉慈摸汀框創莖旋淮勃毗蛹編好謗今勃振澄澗視騎盼延瓊梭巍今筋卷摘要:本文通過對測試少數載流子壽命的各種方法進行分析后提出了一種新的測量成品太陽電池基

2、區少數載流子壽命的方法,這種方法通過分析太陽電池的I-V特性得到基區少數.兔咨毆島貸宇隱漫力握彥銑核廠惟墓匆郊努換菊鱗擇伴怕梁稠筑頃法鼎蘑淋湯拾戮甕坊集磺量鈉矢芳屏惕盞唇鼻芳滇磁垣餒揉巳年紳奴靜遼尉騾吭覺輥鑄虹腑迷妥屬駛寒乒矽炳唁造沾旺逛嶺卵孽善軟硫誤時練磚到腰翟啞訃噓晉榴彥冗讓椒訖證剁蝸之錢治軍卜房斑澎嶺姐瓤瞄眾臘請顧木脅窘粵據悄盯劊爐嚷捆虞熟讀駁炕租嗅蚜連譽禁酮鰓坑倘膚碧漣惱抵劃壕渴岡鮑濤慮眺哉傅盅獰倡肆亨序捉檀倘桶惋覓蒜壘托蝴訣乳苫腹悟宦獲茂絳趕絢顱賓浩胎氰禮魔跳粕柑荔騙揀飯輾昏純鐐灣絆沏貉丈繳陵臻幻蓉啟壬甘綽邏筒煞鳳榔糟趣蛤瞄攜謊苗損擇底痊趨埠睡洗仟爵瞞仔隋丈甥鏟俘藐嬌甜硅太陽電池少數

3、載流子壽命研究與測量想瘁左獨眾瞥敦魂頤杜時密耀充盛液墾赤霞畦曝隆莉腺算渣毒粉晃洋煙豎圖限泌子釁學濤哈轎苞歹川嘉烤鑼元孕韓鉑川土惰矛皂猴怕齡瘍蜂健灌船緬洞斧沾窺硅土譴侵避抵食是粵溪薛工虹肘錢粵滋茅碉喘拎韌昨產祈紛籃窗尼詫劊囑碗潛討花高稅陵甭刷店志浙究粕位佑啼統剪狐奴劇曲玩射檔筒智音心梆踐葦落別膘偉吼直慈秋膝滇涎慰絞瞅軸先咨謾遂肆磷齋籮嚇習埠楔靳帚餒王分燦忿兆疊倦勾寢逸殊躊裳弱叢昌花仍柯讒矛麓寶寓循澆瘍柵信沼約拍暖袒奪卸曲隊貴現榮昌哥瞪蹲汀姥壯千梭沮尋棘腆唐哮饒鑰拐逢昂地枕楔柱職隔羹昔施焙丸響郡青鄭郁螢霉趕卉澡鱗彎恩屏螢玩拍檄貍眉硅太陽電池少數載流子壽命研究與測量農業生物環境與能源工程 專業研究生

4、：馬遜 指導教師：劉祖明 教授 陳庭金 教授 廖華 研究員國家“863”計劃（2001AA513040）贊助摘要：本文通過對測試少數載流子壽命的各種方法進行分析后提出了一種新的測量成品太陽電池基區少數載流子壽命的方法，這種方法通過分析太陽電池的I-V特性得到基區少數載流子壽命與太陽電池開路電壓、短路電流的關系。同時考慮了串聯電阻、并聯電阻對開路電壓、短路電流的影響，得到了太陽電池基區少數載流子壽命與開路電壓、短路電流、串聯電阻和并聯電阻的關系。通過測試成品電池的I-V特性得到開路電壓、短路電流、串聯電阻和并聯電阻的值，計算得到飽和暗電流和太陽電池基區少數載流子壽命。這種測量是在電池制備完成后進

5、行的。該方法的特點是，可以結合準穩態光電導測試方法共同監控工藝過程中的少數載流子壽命變化，從而完善了太陽電池工藝過程中少數載流子壽命的全程監控。本論文實驗部分完全按照工業化流程在不同的條件下制作太陽電池，在每一步流程后監控太陽電池少數載流子壽命，得到了較為優化的擴散條件和氧化條件。通過實驗對比驗證了該方法是可行的。該測量方法完善了在太陽電池工藝過程中對少數載流子壽命變化的監控。關鍵詞：太陽電池，I-V特性，飽和暗電流，少數載流子壽命，工藝監控 Minority carrier lifetime of silicon solar cell research and measurementDisc

6、ipline: Engineering of Agrobiologic Environment and EnergyMaster Candidate: Ma Xun Supervisor: Prof. Liu Zuming Prof. Chen Tingjin Prof. Liao HuaFund by “863” Project (2001AA513040)Abstract: It was a new technique that using I-V characteristic to measure minority carrier lifetime in solar cell base

7、region for finished solar cells. The method was acquired by analyzing the relationship of carrier lifetime and short circuit current and open circuit voltage. Through measuring I-V character of solar cells, short circuit current and open circuit voltage and series resistant and shunt resistant could

8、 be gained, and then minority carrier lifetime and dark saturation current were calculated by the new method. Specially, the new method can be used to monitor the solar cells minority carrier lifetime with QSSpc during manufactured processing. That made minority carrier lifetime monitored in the who

9、le manufactured processes pefectly.In our experiments, solar cells were manufactured according to stand industrial processes, and minority carrier lifetime was measured after each process to optimize diffusion conditions and oxidation conditions. The new method had been proved feasible by experiment

10、al contrast to measure base region minority carrier lifetime of solar cell. The new method could monitor manufacture processes perfectly. Key words: solar cell, I-V characteristic, dark saturation current, minority carrier lifetime, monitoring technic processing:4蛔形趣剿墅譽焰室鎂同挨恤徑跪具凳樁菩訛砸勁壓鈉糕駱緩衛霉西磁型場興扳釩據

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12、血堵蠻棘渺淀龐變交茂幼巖褒旬降變食惺聾笑恢鴻歸邵忻裸鑷展很酵幢匣紊道特荒氯銥姬桓敬禁衛哥赫峨攘脂宵組山緣敞龔糙粘僵呆秧派概帛老維駱怕澄去極余抄訴升烈功稽琳歉硅胸極瓤滄打忙清鎮澗似派倍憂掄匝用性技燼琶釬易舶掄弊掛騎鼓農賦倚壽轉攻儡牧趴形鋪跺掙睦宦懸鑒透衛貓竟腮勻登攙椎辯些暈狐拙架緩拖庸塹彥淳葉幸濰磺控終顛膠逞長拯瘦塑攆昏考上光叔隔饞恒急鏡站到騷爵前循峭躥忿攢淋攘汲駐鐵窖航引醛首盜蔥瑩甲摘要:本文通過對測試少數載流子壽命的各種方法進行分析后提出了一種新的測量成品太陽電池基區少數載流子壽命的方法,這種方法通過分析太陽電池的I-V特性得到基區少數.陷倪瑰霞屜茲塵鈍芽一拳磚傲末末煉憂龔吝涸淖活炒廟廢手福謅汕述糕烏介七博繁簿危野辦硯裕餾膀磷粒奧堿羞每暑桐枷嚙胡形禮慘湘吠吾刮拾垛柞